WAFER THINNING SERVICE

Thinning the die can benefit electronic devices in several ways:

  • Reducing thermal resistance
  • Improving device performance
  • Increasing reliability
  • Lowering overall package height, minimizing die stress, which occurs due to mismatches in the coefficient of thermal expansion (CTE) between the silicon die and the board materials.

The most common technology for wafer thinning is mechanical grinding. Silicon is removed from the backside of the wafer using a two-step process: coarse grinding followed by fine grinding. This is performed using a grinding tool that contains diamond particles of specific dimensions. During coarse grinding, typically 90% of the back grind is completed, significantly reducing the thickness of the wafer. Coarse grinding will cause micro-cracks and damage the silicon lattice. Fine grinding completes the back grind process and removes part of this damage.

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Wafer Thinning

WAFER LEVEL PACKAGING SERVICES

Electroplating

Electroplating, or electrochemical deposition, is the process of using electrodeposition to coat an object in a layer of metal(s) on any substrate. RDL and Copper for example, are part of this process.

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Electroless-Plating

Low-cost mask-less chemical deposition of various metal stacks on wafer surface to serve as intermetallic connection or to enhance product reliability and performance.

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Laser Assisted Bonding

Laser assisted bonding is an interconnection method performed through the laser energy to bond two surfaces of materials together.

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Solder Balling

Various solder deposition technologies to form solder bump for WLCSP and flip chip interconnects.

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Wafer Level Component Assembly

Wafer level assembly by attaching of dies or various passive components on wafer surface.

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Wafer Thinning

Thinning of wafer backside for dies in final packaging.

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Wafer Metal Coating

Application of various metal stacks via evaporation or sputtering technologies on wafer backside for better die performance.

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Wafer Dicing

High precision and accurate singulation of dies on a wafer.

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